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Effect of Single Event Effects on long-lasting and high altitude radiation detection experiments: The Gamma-Flash case.

Preziosi E., Andreani C., Campana R., Gorini G., Picozza P., Romanelli G., Tardocchi M., Senesi R.
  Venerdì 16/09   15:30 - 19:00   Aula L - Christa Mc Auliffe   VI - Fisica applicata, acceleratori e beni culturali   Presentazione
In microelectronics, Single Event Effects (SEEs) occur when particles composing the natural cosmic-rays background ($i.e.$, gamma-photons, neutrons and charged particles) strike specific electronic components ($e.g.$, memories or integrated circuits) causing errors in the systems. The electronics composing the power supply and readout systems of radiation detectors are subjected to SEEs and their performance and reliability can be hampered by this threat. This problem is particularly relevant for long-lasting and high-altitude measurements. One of the purpose of the Gamma-Flash project is the development of a new neutron detection apparatus for the study of high-energy particles production following thunderstorm activity. The apparatus is located and operates on top of Mt. Cimone ({2165 ${m}$ a.s.l., Sestola, Italy). In this work, the influence of SEEs on the performance of the Gamma-Flash neutron detectors is reported, following results from experiments carried out at the ChipIR beamline at ISIS Neutron and Muon Source (UK). The experiments allowed to estimate the influence of the neutron irradiation on the performance of the detectors and the reliability of measurements carried out. Authors gratefully acknowledge the financial support of the Consiglio Nazionale delle Ricerche -- within CNR-STFC Grant Agreement [No. 2014-2020 (N 3420)] concerning collaboration in scientific research at the ISIS (UK) of STFC -- and of the JRU ISIS@MACH ITALIA, Research Infrastructure hub of ISIS (UK) -- MUR official registry U. 0008642.28-05-2020.