Internal losses measurement of a dual-mode photodiode at cryogenic temperature.

The chipSCALe project is focussed on developing a more robust linkage to the revised SI candela for optical power measurements. The target of this project is to realize the first "NMI-on-chip" for optical power measurement. Here we present primarily results on a cryogenic temperature dual-mode self-calibrating detector that combines predictable quantum efficiency photodiodes (PQED) with electrical substitution radiometry for determination of optical power. The thermal detection is used as reference in the detector to determinate directly the internal losses of the photodiode without the need of an external reference. We report on dual-mode internal loss estimation measurements with radiation of $632 {nm}$ at different power levels from $0.1 {mW}$ to $1.5 {mW}$.